Technical Specifications S 3245 UV/Vis Detector
Wetted Materials: Stainless Steel / PEEK*
Baseline Noise: ± 1 x 10-5 AU (@240 nm, 2 sec. Risetime)
Baseline Drift: < 3 x 10-4 AU/h
Wavelength Range: 190 – 800 nm
Wavelength Accuracy: ± 2 nm
Linearity: > 2.0 AU
Light Source Deuterium Lamp, Tungsten Lamp
Wavelength Program: Programmable, 10 steps
Analog Output: 1x 1 V (optional: 2x 1V)
Control Features: Internal Peak Detector with +24 V solenoid switching output.
Dimensions: (W x H x D) 310 x 165 x 478 mm
Power Supply: 100 – 250 ~V (47 – 63 Hz)
